Bruker releases the world's fastest new atomic force microscope
On May 2, 2011 local time in California, USA, Bruker released a new atomic force microscope with innovative and unique appearance-Dimension FastScanTM, which improves microscope imaging without sacrificing nanometer resolution A major breakthrough has been made in speed. Dimension FastScanTM is hundreds of times faster than other AFM scans. It can produce results in seconds or minutes instead of hours or days. It is the fastest high-resolution atomic force microscope in the world.
In view of the increasing demand for observing and understanding materials on the nanoscale, as the newest member of the world's most widely used atomic force microscopy platform, Dimension FastScan uses several innovative technologies to enable fast scanning speeds, high resolution images and Accuracy is perfectly balanced. Based on the successfully designed atomic force microscope architecture, Dimension FastScan is a tip-scanning system that can provide measurement of large and small samples in air or liquid.
"Dimension FastScan achieves one of Bruker ’s goals in atomic force microscope technology. This instrument will enable our users to work more efficiently without losing the resolution and accuracy of the image. In such a short time to complete high Quality image, this is a breakthrough. â€Dr. Mark R. Munch, President of the Nano Surface Division of Brooke said,“ Using 38 patented technologies, Dimension FastScan has a higher scanning speed than previous research-level atomic force microscopes. It's unique. "
"By providing more effective access to nanoscale information, Dimension FastScan expresses Bruker's commitment to the scientific community." Bruker's vice president and general manager of atomic force microscope business David V. Rossi added, "Our new Dimension FastScan, its ScanAsyst, PeakForce QNM and other Bruker's Atomic Force Microscope products combine to significantly improve work efficiency while also providing new quantitative information at the nanometer level. This will make Bruker's Atomic Force Microscope series products more easily used by academia and industry. . "
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